X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More about X-ray Instruments and X-ray Systems

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments

NDT supplies and accessories are components, ancillary equipment, standards, and consumable materials used in non-destructive testing (NDT). Search by Specification | Learn More about Nondestructive Testing (NDT) Supplies and Accessories

Non-destructive testing (NDT) services use test methods to examine an object, material or system without impairing its future usefulness. Search by Specification | Learn More about Nondestructive Testing (NDT) Services

Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More about Imaging Workstations

Non-destructive testing (NDT) material testers are devices, machines and equipment that are used to determine residual stress, alloy type, hardness, microstructure, elasticity, heat treatment and other material conditions without permanently altering or destroying the material being examined. Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers

X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments

X-ray tubes and sources are lamps that produce X-rays. Learn More about X-ray Tubes and Sources

X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More about X-ray Fluorescence Spectrometers

Illuminators are used to provide adequate contrast for imaging. Illuminators include backlights, LED illuminators, and fiber optic illuminators. Search by Specification | Learn More about Illuminators

Video cameras take continuous pictures and generate signals for display or recording. They capture images by breaking them down into a series of lines. This search form does not include consumer devices such as camcorders. Search by Specification | Learn More about Video Cameras

Analytical laboratory services detect, classify and/or assay chemical, material, biological, geological and environmental samples. Search by Specification | Learn More about Analytical Laboratory Services

Calibration and repair services for vibration, acoustic, electrical / electronic test, environmental, dimensional, NDT, analytical, process and other specialty instruments, sensors and related equipment. Search by Specification | Learn More about Calibration and Repair Services

Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc Search by Specification | Learn More about Thickness Gages