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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find wafer monitoring-related products, suppliers, datasheets and CAD.
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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Condition monitoring and machine maintenance services monitor the condition of critical machines, battery banks, power supplies, processes and rotary equipment. They also perform predictive maintenance (PdM) and/or preventive maintenance. Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
Thin film process monitors are used to control thin film deposition rate or composition during processing. Learn More
...sampling, sample pickup, sample retention, standards testing, and report preparation. Analytical laboratory services that provide geotechnical, industrial hygiene, material testing, and umpire testing services are also available. Monitoring programs, audits... Search by Specification | Learn More
Tool monitors optimize machine tool operating conditions based on feedback from a sensor or probe. Search by Specification | Learn More
Predictive maintenance (PdM) systems and condition monitoring systems are used to predict equipment maintenance, and to monitor corrosion, oil condition, bearing wear, overheating and other parameters than can lead to the breakdown of capital Learn More
Safety monitoring systems monitor and collect information from machines and operations. If a safety fault occurs, they can signal an operator to take appropriate action, or perform the action automatically. Learn More
Protective relays and monitoring relays detect or monitor for abnormal power system conditions. Search by Specification | Learn More
Groundwater monitoring equipment includes pumps and other instruments that tap into the water table for water quality assessment, testing for pollutants, and the identification of other compounds. Learn More
Video monitors display video images from cameras and recorders, often using cathode ray tube (CRT) technology. Search by Specification | Learn More
Supervisory circuits and battery monitor chips are semiconductor devices that detect and monitor voltage levels in power supplies, microprocessors, and other systems. Search by Specification | Learn More
CRT monitors use cathode ray tube technology to display output from a computer. Search by Specification | Learn More
Process monitors measure and analyze temperature, pressure, flow and other processing parameters to maintain product quality and safe production operating conditions. Learn More
...available. Selecting oil in water monitors requires an analysis of application requirements and, in some cases, certifications. Some products are designed to monitor diesel, gasoline, or jet fuel in storm water or industrial waste streams. Others... Search by Specification | Learn More
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Semiconductor Thickness -- CHRocodile MI5 Precitec, Inc.
Sputtering Targets made of Silver Available Testbourne Ltd.
Silicon Ingot Inspection System DWFritz Automation, Inc.
Motorized Semiconductor Wafer Shuttle Stage Prior Scientific, Inc.
Automated 3D Wafer Metrology Tool DWFritz Automation, Inc.
New Range of Rotatable Sputtering Targets Testbourne Ltd.
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The Proforma 300 TM wafer thickness gage can be used to measure thickness, bow and TTV on all wafer materials including: silicon,gallium-arsenide,indium phosphide and germanium without recalibrating or electrically grounding the wafer. (read more)
Solar Wafer Thickness Tool from MTI. The PV-1000 is a High speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. (read more)
Inspect wafers that are bowed due to MEMS micro machining. Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)
Omron is a world leader in the Blood Pressure Monitor market. In September of 2009, they surpassed the 100 Million unit mark in sales of their home-use monitors. Contributing to this success is the use of Omron's MEMS Pressure Sensors. (read more)
Rogue Valley Microdevices offers PECVD Silicon Carbide (SiC), which is a single side deposition. This highly durable thin film can be deposited alone or within stack of PECVD Oxide and/or Nitride. PECVD Silicon Carbide is the perfect choice for use as a hard mask for bulk micromachining of your finished wafers. We are able to process wafer diameters of 50mm up to 300mm. (read more)
Rogue Valley Microdevices is pleased to offer PECVD Silicon Carbide. This highly durable thin film can be deposited alone or within stack of PECVD Oxide and/or Nitride films. PECVD Silicon Carbide is the perfect choice for use as a hard mask for bulk micromachining. Rogue Valley Microdevices process all wafers and films in-house at our Medford, Oregon facility. (read more)
Rogue Valley Microdevices offers Dry Thermal Oxide. Our ultra pure Dry Oxidation process is available for those applications requiring thinner oxides. We offer Chlorinated and Non-Clorinated Dry Thermal Oxide. Using Dry Chlorinated Thermal Oxide can help your devices perform to their highest potential by eliminating metal ions. (read more)
Silicon Wafers - Because of our ability to process all wafers diameters (50mm-300mm) Rogue Valley Microdevices maintains a diverse inventory for customers whom require either bare silicon wafers or silicon wafers with Thin Films. Our ability to provide you with both thin films services and silicon wafers can help reduce cycle time as well as shipping cost. (read more)
Rogue Valley Microdevices offers PECVD Silicon Carbide (SiC), which is a single side deposition. This highly durable thin film can be deposited alone or within stack of PECVD Oxide and/or Nitride. PECVD Silicon Carbide is the perfect choice for use as a hard mask for bulk micromachining of your finished wafers. We are able to process wafer diameters of 50mm up to 300mm. (read more)
Etched Foil Heaters, for the Semiconductor & Wafer Processing industry, from Thermal Circuits. In the early 1980's, Thermal Circuits introduced HTB etched foil element heaters to the Semiconductor industry to heat acid in portable wafer processing baths. It replaced hot plates that only heated from the bottom. (read more)
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Wafer charge monitoring invention Wafer charge monitoring USPTO Application #: 20070187615 Title: Wafer charge monitoring |
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Safety monitoring mechanism of a wafer fabrication platform... Safety monitoring mechanism of a wafer fabrication platform -> Monitor Keywords Safety monitoring mechanism of a wafer fabrication platform |
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Implementation of Fast Wafer Level Reliability Monitoring... Implementation of Fast Wafer Level Reliability Monitoring Strategy for Wafer Fab Process Monitoring |
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Effective in-line defect monitoring with variable wafer area... Effective in-line defect monitoring with variable wafer area coverage |
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MTI Instruments | Precision Instruments | Non-contact... We also offer wafer thickness gaging instruments, noncontact gages and displacement probes and sensors for edge and repetitive and nonrepetitive |
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Monitoring Bioconversion Processes - GCEP Monitoring Bioconversion Processes Results and Publications |
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Technical Operations Support - I. Delivery Order 0033:... Technical Operations Support - I. Delivery Order 0033: Structural Monitoring With Piezoelectric Wafer Active Sensors See Storming Media LLC Information |
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Development of voltage contrast defect inspection technique... this technique, the inspection of 300mm wafer size hp 90nm contact logic production wafer for line monitoring was carried out. |
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Health Monitoring and Smart Nondestructive Evaluation of... Health Monitoring and Smart Nondestructive Evaluation of Structural and Biological Systems III (Proceedings Volume) |
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Sandia National Laboratories: Method and Apparatus for... Risk Assessment Tools Safeguards and Security SAR Sensors Sensors and monitoring Simulation and Integration Telemetry, Sensor and Data Systems |