|
|
|
Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find Thin Film Measurement-related products, suppliers, datasheets and CAD.
 |
Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Products/Services for Thin Film Measurement
Thin film materials are high purity materials and chemicals such as precursor gases, sputtering targets or evaporation filaments used to form or modify thin film deposits and substrates. Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
Thin film process monitors are used to control thin film deposition rate or composition during processing. Learn More
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation. Search by Specification | Learn More
Thin film coating services apply very thin layers of specialized materials to part surfaces. They perform processes such chemical vapor deposition (CVD), physical vapor deposition (PVD), ion implantation, electrochemical deposition (ECD), plasma etching, rapid thermal processing (RTP), and titanium nitride coating. Search by Specification | Learn More
Thin film sources consist of magnetrons, evaporation thermal units, ion beams and other sources that produce deposition materials (vapors or ions) in a thin film system. Learn More
Thin film circuits and thin film products are metallized or plated onto ceramic substrates. Learn More
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Material testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact. Search by Specification | Learn More
Metallized and coated films have a coating or thin metal film for decorative or functional applications. Search by Specification | Learn More
Specialty tapes and films use proprietary or patented technologies and constructions, and are designed for specific industries and specialized applications. Search by Specification | Learn More
Packaging tapes and films are used to seal or wrap boxes, bottles or other packages. Search by Specification | Learn More
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More
Coating services coat or plate the surfaces of manufactured components. Coating processes include ceramic, coil, dip, dry lubricant, phosphate, powder, rubber, thin film, titanium, and selective coating. Coating services also perform chemical Search by Specification | Learn More
Adhesive tapes and films temporarily or permanently join materials together. Search by Specification | Learn More
|
||||||||
Sputtering Targets for High Purity Metals.... Testbourne Ltd.
Custom Thin Film Materials Indium Corporation
Materials for Photovoltaic Module Assembly Indium Corporation
Solar Materials - CIG Alloy Sputtering Targets Indium Corporation
What is NanoFoil®? Indium Corporation
Vacuum Evaporation Sources for thin films Testbourne Ltd.
|
Product News for Thin Film Measurement
Thin Film Measurement System
StellarNet, Inc. announces a new line of Thin Film measurement systems starting as low as $10k. (read more)
Inficon/Maxtek/ Thin Film Measurement Equipment
Thin Film Measurement Equipment (read more)
Sensor Quartz Crystals Thin Film Measurement
Thin film measurement accuracy and crystal life are a function of Sensor Crystal Quality. To assure that each crystal is optimised for maximum process yields and minimum downtime 100% inspection is employed. Every crystal is inspected from the Quartz Blank stage, right through to the last coating process and final frequency selection. (read more)
Ultra-Precision Thin Film Chip Resistors
RCD's new family of BLU-chip series resistors are intended for precise measurement and control applications in medical, industrial, communications, and most applications where outstanding TCR's are a critical design factor. RCD's BLU-chip series are available in a wide range of case sizes including 0201, 0402, 0603, 0805, 1206, 1210, 2010, and 2512. (read more)
Thin Film - RC / RCD - Thin Film
Thin Film - RC / RCD: Integrated thin film resistor capacitor diode network termination products are built on silicon substrates from Universal Semiconductor, Inc. USI's thin film resistors, capacitors and diodes are fabricated using proprietary, state-of-the-art thin film technology that offers high performance at very high frequencies... (read more)
Avantes Multi-Layer Thin Film Solution
Avantes is pleased to announce a partnership with Angstrom Sun Technologies of Acton, MA for the resale of their TFProbe multi-layer thin film software along with select thin film metrology systems for the UV/VIS and NIR. (read more)
Thin Film Resistance Temperature Detectors
Spectrum Sensors & Controls has developed a line of Resistance Temperature Detectors (RTDs) using thin film technology that provides excellent sensing at a lower cost than wire wound elements. Spectrum's RTDs are available with both nickel and platinum elements, and set the highest standard in temperature measurement devices. (read more)
Thin Film Air Velocity
AirTest offers a compact and highly accurate airflow measurement technology based on a new heated, thin film anemometer design. (read more)
2M Thin Film - Thermopile Detector
Thin film. Offers extremely high output with best signal-to-noise performance with a time constant of 85ms when encapsulated with Argon gas. Excellent for gas analysis, fire detection and non-contact temperature measurement. (read more)
PECVD Silicon Carbide Thin Film
Rogue Valley Microdevices offers PECVD Silicon Carbide, which is a single side deposition. This highly durable thin film can be deposited alone or within stack of PECVD Oxide and/or Nitride. PECVD Silicon Carbide is the perfect choice for use as a hard mask for bulk micromachining of your finished wafers. We are able to process wafer diameters of 50mm up to 300mm. (read more)
Conduct Research
-
Temperature Compensated Bulk Acoustic Thin Film Resonators
Thin film resonators have been made that exhibit a high degree of temperature compensation. These resonators are composed of piezoelectric aluminum nitride films, aluminum top and bottom electrodes,...(read more)
-
Near Infrared ( NIR ) Applications with Miniature Fiber Optic Spectrometers
Miniature fiber optic spectrometers that interface to computers have been around for about 10 years. These small instruments are low-cost and therefore widely used in many different industrial...(read more)
-
Vision Systems for Wafer and Thin-Film Instrumentation
Vision systems for wafer and thin-film instrumentation include specialized optical instruments such as microscopes or imaging, CD resolution, defect detection and classification, surface roughness,...(read more)
-
Piezoelectric Characterization of Bulk and Thin Film Ferroelectric Materials using Fiber Optics
In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectic...(read more)
-
Stress Measurement Calculations of Thin Film Layer Deposition on Wafers Using Dektak Stylus Profilers
Film deposition and planarization processes employed in the manufacture of semiconductors, MEMS, thin film filters and other devices, generate stress in both the substrate and the deposited film....(read more)
-
Temperature Coefficient and Ageing of BAW Composite Materials
Thin film resonators have been made that exhibit a high degree of temperature compensation. These resonators are composed of piezoelectric aluminum nitride films, aluminum top and bottom electrodes,...(read more)
-
Deposition Control and Measurement
The SQM-160 measures thickness and deposition rate of the thin film deposition process. The base unit can monitor from 2 independent measurement channels. Four relays are available to control source...(read more)
-
Available Humidity, Dew Point, and Moisture Sensors, Probes & Connectors
For humidity measurements various methods are used that differ from each other mainly with regard to their accuracy and their suitability for long term measurements and the substance used for the...(read more)
-
Residual Stress Instruments
Structure or residual stress instruments are capable of discerning microstructural, chemical bond type, or structural features of wafer or thin film deposits. Microstructural features include phase...(read more)
-
Ammonia Pressure Measurement using Thermal Flash Protection (.pdf)
Situation: Ammonia offers refrigeration pump and compressor manufacturers an improved efficiency over Freon based systems. However, the thermodynamic behavior of ammonia is very different from Freon....(read more)
|
2001 Building Publications - Direct Measurement of Plowing... Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope. |
|
|
Vishay - manufacturer of discrete semiconductors and passive... Vishay Releases Industry's First Series of Quad Precision Thin Film Surface-Mount Resistor Networks With Custom Circuit Capability in 5-mm by 5-mm See Vishay Intertechnology, Inc. Information |
|
|
INFICON provides world-class instruments for gas analysis,... See INFICON Information |
|
|
Applications of Thin Film Thermocouples for Surface... TITLE AND SUBTITLE: Applications of Thin Film Thermocouples for Surface Temperature Measurement AUTHOR(S): Lisa C. Martin and Raymond Holanda REPORT |
|
|
Optical Measurement of Biaxial Strain in Thin Film Polymers Optical Measurement of Biaxial Strain in Thin Film Polymers Rand, JL President, Winzen Engineering, Inc., TX Grant, DA Staff Engineer, Winzen See ASTM International Information |
|
|
ASTM D5796 -03 Standard Test Method for Measurement of Dry... Measurement of dry film thickness of organic coatings by physically cutting through the film and optically observing and measuring the thickness See ASTM International Information |
|
|
MATLAB Central - File detail - Optical Strain Measurement by... Optical Strain Measurement by Digital Image Analysis See MathWorks, Inc. (The) Information |
|
|
Density measurement of a thin-film by the... Journal Title: Instrumentation and Measurement, IEEE Transactions on Item Title: Density measurement of a thin-film by the pressure-of-flotation |
|
|
Development of a micro-generator based on... Keywords: Thin films, Annealing, Temperature measurement, Bismuth, Temperature, Resistance, Materials, Reactive power, Measurement by laser beam, |
|
|
Research on the measurement of thin film thickness based on... According to the characteristics between the thin film thickness and the unwrapping phase, taking advantage of the overlapping 4-frame average |
More >>
