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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find semiconductor metrology-related products, suppliers, datasheets and CAD.
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Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Search by Specification | Learn More
Video cameras take continuous pictures and generate signals for display or recording. They capture images by breaking them down into a series of lines. This search form does not include consumer devices such as camcorders. Search by Specification | Learn More
Semiconductors (metalloids) or semiconductor materials are used to fabricate microelectronic and optoelectronic devices such as transistors, photodetectors or solar cells. Learn More
Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Learn More
Semiconductor foundry services suppliers design and manufacture semiconductor chips on a contract basis, in prototype to production quantities. Search by Specification | Learn More
...marine, medical, military, pharmaceutical, or packaging applications. Other test chemicals are used in electronic devices, semiconductors, or integrated circuits (ICs). Selecting material testing services requires an analysis of testing methods. Ash... Search by Specification | Learn More
Metal-oxide semiconductor field-effect transistors (MOSFETs) are electronic switching devices with a conducting channel as the output. An electrode called a gate controls the width of the channel and determines how well the MOSFET conducts Search by Specification | Learn More
Semiconductor wet process equipment performs a variety of wet processing applications including etching, washing, chemical mechanical polishing (CMP), and spin coating in semiconductor or microelectronics manufacturing. Learn More
Semiconductor equipment repair services repair, rebuild and refurbish equipment related to the manufacture and processing of semiconductors. Learn More
Semiconductor cluster tools and equipment are used to process semiconductor wafers for the production of microelectronic components. Learn More
Specialized or proprietary products and accessories related to the manufacture of electronic or semiconductor components. Learn More
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Silicon Ingot Inspection System DWFritz Automation, Inc.
Motorized Semiconductor Wafer Shuttle Stage Prior Scientific, Inc.
Semiconductor Thickness -- CHRocodile MI5 Precitec, Inc.
New Range of Rotatable Sputtering Targets Testbourne Ltd.
Sputtering Targets made of Silver Available Testbourne Ltd.
Automated 3D Wafer Metrology Tool DWFritz Automation, Inc.
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Inspect wafers that are bowed due to MEMS micro machining. Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)
The new CHRocodile MI5 from Precitec Optronik is a new modular design of the CHROcodile IT. The CHRocodile IT offers highly accurate distance and thickness measurements with a single probe for semiconductor wafers and multi-layered thin film. Non-contact scanning with just one measuring point can measure a wafer precisely to a thickness of 1 mm in all production environments. (read more)
The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)
The Prior Scientific motorized Shuttle Stage is designed to be used with the Nikon and Olympus wafer loader systems for 3, 4, 6, and 8 inch wafers. The system greatly reduces operator fatigue while increasing inspection accuracy and repeatability. (read more)
ECG semiconductors were originally intended for the replacement, hobbyist, and experimental markets and in time found applications in industrial repair and maintenance departments. (read more)
Mouser Electronics, Inc., known for its rapid introduction of the newest products, today announced it is the first distributor to stock OSRAM Opto Semiconductors' OSLON SX LED series. OSRAM is a world leader in manufacturing optoelectronic semiconductors for the lighting, sensor, and visualization sectors. (read more)
SEMICONDUCTOR BUYING SHOULD NOT TAKE TIME, MONEY, OR ENERGY.
USE THE AMERICAN MICROSEMICONDUCTOR YAHOO! STORE FOR PURCHASING. (read more)
CNC Industries, Inc. believes their Metrology department is second to none. From the many highly experienced and qualified quality specialists that they have, to the best equipment available, they have the tools needed to manage and keep up with the huge volume of parts moving through the company on a daily basis. (read more)
Along with our turn-key systems, we also offer a full range of 3D measuring and inspection services. At SPG Data 3D we are committed in providing added value to your department and organization. Whether that is to deliver our expertise in engineering & metrology or simply to reduce your operational costs by means of our professional Accu3D metrology measurement services. (read more)
Every once in a while, a new product comes around that changes the rules. It happened when we introduced handheld dry-wells. It happened when we introduced Micro-Baths. Now we've combined bath-level performance with dry-well functionality and legitimate reference thermometry to create Metrology Wells. (read more)
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Semiconductor Metrology Instruments Information | Business.com Semiconductor Metrology Precise Metrology & Control of Wafer Geometry & Surface Topography www.KLA-Tencor.com See Business.com, Inc. Information |
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Semiconductor Links - Semiconductor and Cleanroom Related... Film Thickness Measurement and Semiconductor Metrology Semiconductor Links Semiconductor related resources for the semiconductor industry |
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Boin's Semiconductor Links - Chips, IC, Silicon Wafer &... You are here: Semiconductor Links > Index |
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Used Semiconductor and Scientific Equipment for Science and... Semiconductor Hybrid / Assembly Semiconductor Wafer Metrology See Capovani Brothers, Inc. Information |
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Netscape | Company Boardroom orders for its automated atomic force microscope and profiler semiconductor metrology tools during the recently completed second quarter of 2000. |
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Netscape | Company Boardroom |
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PI: Markets/Applications | Precision Solutions for... Semiconductor Technology Biotechnology, Life Science, ... See Physik Instrumente (PI) GmbH & Co. KG Information |
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:: Frontier Semiconductor, Inc :: Products Applications Optical Metrology Electrical Metrology Material Characterization Sales Support See Frontier Semiconductor, Inc. Information |
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ATP Project Brief - 00-00-5866 Spintronics-Based High-Resolution, Non-Invasive, and Ultrafast Metrology for the Semiconductor Industry |
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Microelectronics Semiconductor Research Projects Conducted in Support of the NIST National Semiconductor Metrology Program |