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Parts by Number for MIL-STD-883
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| MIL-STD-883 | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
| MIL-STD-883 | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
| MIL-STD-883A | netCOMPONENTS | Not Provided | Not Provided | Not Provided |
Engineering Web Search: MIL-STD-883
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PCN#: G-0110-06 Bias) Temperature Cycling MIL-STD-883 45/0 45/0 45/0 1/7/02 (-65?C to +150?C, 500 cyc) Method 1010 Life Test MIL-STD-883 77/0 77/0 77/0 1/18/02 See Integrated Device Technology Information |
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Integrated Device Technology, Inc. 6024 Silver Creek Valley... See Integrated Device Technology Information |
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Xilinx: Table 2B: Hermetic Package/Product Monitor... REFERENCE SPEC Mil-Std-883 / JEDEC/STACK Mil-Std-883 Mtd 2015 B1026 1 device per chemical for 1 minute, then brush 10 times See Xilinx, Inc. Information |
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RELIABILITY MONITOR DS1230AB-200 JUL '00 Monitor DEVICE... |
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SCOPE: DUAL POWER MOSFET DRIVER Device Type Generic Number... The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 Case Outline Package Code JA GDIP1-T8 or CDIP2-T8 8 See Maxim Integrated Products, Inc. Information |
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5962-3826705MXAC7200 128K x 8 EEPROM, CMOS, MIL-STD-883,... 128K x 8 EEPROM, CMOS, MIL-STD-883, 150ns 128K EEPROM MIL-STD-883, 250ns 5962-3826707MXAC7200 See Intersil Corporation Information |
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Friday, Mar 7, 2008 10:56 AM / 14-Bit CCD/CIS Signal Processor... is per MIL-STD-883 Method 1015 test condition D. 5.3 Steady state life test is per MIL-STD-883 Method 1005, test condition D. 6.0 MIL-STD-38535 QMLV See Analog Devices, Inc. Information |
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Test Flows for Space PEMs Mil-Std-883 Method 3015 is used. The purpose of this test is to MIL-STD-883 TM 2010 CONDITION B No No |
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Littelfuse - Part #SP0505BAJT MIL-STD-883 Method 3015 (HBM) Close Info MIL-STD-883 20 Package Size Close Info |
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A user's view of the new MIL-STD-883 Procedure 5012 A user's view of the new MIL-STD-883 Procedure 5012 |
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