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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find dimensional metrology-related products, suppliers, datasheets and CAD.
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The Ultimate Resource for Engineering and Technical Research. (Learn More) |
Products/Services for dimensional metrology
Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn More
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More
Dimensional and profile scanners gather two-dimensional (2D) or three-dimensional (3D) information about an object. Search by Specification | Learn More
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn More
Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Learn More
Specialty or proprietary gages, instruments or gaging systems for dimensional measurement. Learn More
Squares are used to indicate, by visual comparison, whether two surfaces are perpendicular. Most products consist of a simple, fixed standard and a beam and blade with a mutual orientation of 90 degrees. Search by Specification | Learn More
...measurements of a product or component's dimensional, form and orientation attributes such as length, thickness, level, plumbness and squareness. Measuring or shop tools include rules, linear scales, protractors and angle gages, level and inclinometers... Search by Specification | Learn More
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More
Micrometers are instruments for precision dimensional gaging consisting of a ground spindle and anvil mounted in a C-shaped steel frame. Noncontact laser micrometers are also available. Search by Specification | Learn More
Condition monitoring and machine maintenance services monitor the condition of critical machines, battery banks, power supplies, processes and rotary equipment. They also perform predictive maintenance (PdM) and/or preventive maintenance. Search by Specification | Learn More
Although most surface profilometers provide only a two-dimensional (2D) or line file, some instruments can provide three-dimensional (3D) or areal topography measurements. Surface profilometers differ in terms of measurement capabilities... Search by Specification | Learn More
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system Search by Specification | Learn More
Air gages use pneumatic pressure and flow to measure or sort dimensional attributes. Search by Specification | Learn More
Microscopes are instruments that produce magnified images of small objects Search by Specification | Learn More
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WACO CAN TEST GAUGES Wilkens-Anderson Company
WACO COUNTERSINK DEPTH GAUGES Wilkens-Anderson Company
Barcor Chamfer Gages Gaging.com LLC
Indicator Gage Measures IDs/ODs on the Shop Floor Mahr Federal Inc.
Mahr Federal At EASTEC 2009 Mahr Federal Inc.
Tooling Balls Kaydon Corp., Industrial Tectonics
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Product News for dimensional metrology
Surface Metrology Service Applications
The Surface Metrology Laboratory, located at Arnprior Rapid Manufacturing Solutions, houses the latest in 2D and 3D surface measurement and mapping instrumentation, customized profilometry software, and surface metrology expertise, (read more)
Metrology Services
Along with our turn-key systems, we also offer a full range of 3D measuring and inspection services. At SPG Data 3D we are committed in providing added value to your department and organization. Whether that is to deliver our expertise in engineering & metrology or simply to reduce your operational costs by means of our professional Accu3D metrology measurement services. (read more)
Automated 3D Wafer Metrology Tool
Inspect wafers that are bowed due to MEMS micro machining. Achieve 0.1 micron resolution, 3 Dimensional (3-D) metrology, and inspect both sides of the wafer simultaneously in a system that is SECS/GEM compliant and is compatible with Class 10 or above Clean Room Applications. (read more)
MarSurf™ WS 1 Optical Surface Metrology System
Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. (read more)
Metrology Services
Burloak's metrology team provides advanced measuring services. Our capabilities include large capacity dimensional inspection, reverse engineering, alignment services, rapid prototyping, part to CAD & CAD to part inspection, body in white inspection, digitization of patterns and tooling, jig & fixture certification as well as assembly, installation support and verification. (read more)
Cleanroom Metrology
Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. (read more)
Wafer Metrology Measurement Tool
The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)
Three Dimensional (3D) Laser Scanner
K-TEK Announces Industry's First 3D Laser Scanner for Real-Time, Non-Contact Volumetric Measurement of Bulk Materials.
3D laser scanner provides real-time volume measurement of silos and stockpiles; 2D laser scanner provides volume flow measurement of conveyor-based materials. (read more)
Dimensional Management
A complete treatise on the subject of dimensional management, this book is designed to provide the reader with a comprehensive systems approach to all facets of dimension and tolerance development, analysis, inspection and documentation. (read more)
PART HANDLING ROBOT, TWO-DIMENSIONAL ROBOT
The Branson TDR Series two-dimensional robots are microprocessor or PLC based automated parts handling systems. Designed by cleaning people for use in cleaning operations, these units are ruggedly constructed and appropriate for use in either production or clean room environments. (read more)
Conduct Research
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Utilizing Laser Technology in Dimensional Metrology Applications
The wavelength of light provides a very high resolution, linear, and stable reference for dimensional measurement. Labmaster® instruments effectively couple the wavelength of light to the part to...(read more)
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3D MEMS Metrology with Optical Profilers
Faster product development and reduced time-to-market have made optical surface profilers essential tools for three-dimensional metrology of MEMS. The Veeco Instruments Wyko® NT Series Optical...(read more)
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3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology (AN91) (.pdf)
3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology double for each device node at 90nm Introduction and below, which means a significant As increasing demand...(read more)
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3D MEMS Metrology with Stylus Profilers (AN60)
Three dimensional measurement capability is increasingly a key requirement for manufacturing commercially viable MEMS. Stylus profiling and the Atomic Force Profiler (AFPTM) solve certain metrology...(read more)
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Optical Metrology for Large Telescope Optics
In recent years the demand for meter-scale optical elements has increased significantly, driven by growth in terrestrial and satellite-based astronomy, and defense and security applications. Laser...(read more)
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Scanning Probe/Atomic Force Microscopy: A Technology Overview (AN48)
Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunneling microscopes (STMs). In their first...(read more)
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Characterizing CMP Pad Conditioner (AN540)
Faster computer processors require smaller features for integrated circuits (IC), which in turn require smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most...(read more)
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Product Catalog > Proceedings Of The International Forum On... Proceedings Of The International Forum On Dimensional Tolerancing And Metrology |
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C&S Connect - B89 Stds Com Metrology Home Page B89 DIMENSIONAL METROLOGY New C&S Connect Version 3.2 (Major upgrades effective 1/8/09) What's New! |
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Dimensional and Visual Inspection Products - Florida Metrology About Florida Metrology We are distributors for leading manufacturers of dimensional and visual inspection products. See Florida Metrology Information |
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Dimensional Metrology, Dimensional Metrology Manufacturers,... Dimensional Metrology Find manufacturers & suppliers of dimensional metrology by category |
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Machine Vision and Three-Dimensional Imaging Systems for... Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II (Proceedings Volume) |
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Two- and Three-Dimensional Methods for Inspection and... Two- and Three-Dimensional Methods for Inspection and Metrology VI (Proceedings Volume) Geometric errors in 3D optical metrology systems |
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Society of Manufacturing Engineers Abstract for Dimensional Micro and Nano Metrology Dimensional Micro and Nano Metrology Author(s)/Editor(s) |
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Society of Manufacturing Engineers Abstract for Advances in Scanning Force Microscopy for Dimensional Metrology Advances in Scanning Force Microscopy for Dimensional Metrology |
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Engineering Metrology Toolbox Uncertainty and Dimensional Calibrations Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results Traceability of Laser |
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ROMER Portable Coordinate Measuring Machines is an integral brand of the Hexagon Metrology group, which offers the broadest selection of dimensional metrology products and services in the world. See ROMER, a brand of Hexagon Metrology, Inc. Information |
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