|
|
|
Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find 4-point probe-related products, suppliers, datasheets and CAD.
|
The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More) |
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More about CMM Probes
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More about Electrical Test Probes
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More about Temperature Probes
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More about Thermistor Temperature Probes
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More about Thermocouple Temperature Probes
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More about Position Probes
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More about IC Pin Probes
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More about Styli and Probes
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More about RTD Temperature Probes
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More about Nondestructive Testing (NDT) Probes
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More about Eddy Current Probes
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
Corrosion probes, corrosion coupons and corrosion coupon holders are corrosion-sensing devices that interface to instruments or monitors. Learn More about Corrosion Probes, Coupons and Holders
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. Search by Specification | Learn More about Temperature Instruments
...number of moving probes rather than the high number of fixed probes in the BON. Test times may be slower due to probe movements, but the method has compensating benefits. In practice, a flying probe can provide close to 100% test coverage on a board... Search by Specification | Learn More about Automated Test Equipment
|
|
||||||||
RMP600 machine probe out-of-sight in 3D precision Renishaw
2-in-1 versatility - Scanning probes for your CMMs Renishaw
Sheffield CMM-V Vision Probe Gaging.com LLC
Fiberscope, Flexible Boroscope: FI4-2BDP-1350 Medit
STM6® Series Measuring Microscopes Olympus America Inc.
Inverted Microscopes Ludl Electronic Products, Ltd.
|
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes. (read more)
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Cable-free OTS Twin-Probe System from Renishaw performs automated part set-up, measurement, tool setting and broken tool detection. The machine tool system combines a spindle-mounted OMP40-2 inspection probe and OTS tool-setting probe with an optical receiver, enabling fast system integration and cable-free installation on machining centers, especially with twin pallets and rotary tables. (read more)
Heidenhain has developed a new interface for its 3-D touch trigger probes (read more)
For broken tool detection and rapid tool length/diameter measurement use the new OTS, Renishaw's first tool setting probe with optical transmission. The robust, compact and cable-free design allows freedom of table movement, ideal for twin pallet or rotary table machines. (read more)
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
The New A-Zoom Micro offers an economical solution for semiconductor probing or circuit board and flat-panel display inspection without sacrificing features, function or performance. (read more)
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 4LB21 | Grainger Industrial Supply | MITUTOYO AMERICA CORPORATION | Scribers and Probes | Scriber,Straight Point,6 1/8 In L |
| 4LB20 | Grainger Industrial Supply | MITUTOYO AMERICA CORPORATION | Scribers and Probes | Scriber,Straight Point,6 3/4 In L |
| RH-4-SC | Newark | IDI | Test | Test Spring Probe; Connector Type:Test Point; Color:Gold; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes; Series:RH; Contact Termination:Solder; Current Rating:5A RoHS Compliant: Yes |
| PT4 6X150-KNE | Newark | LABFACILITY | All Supplier Direct Ship | PROBE, PT100, IN HEAD, 150MM; Approval Category:BS 1904 (1984) Class B, DIN 43760; Diameter, External:6mm; IP Rating:IP67; Length, Probe:150mm; Range, Measuring:-50?C to +450?C; Resistance, Ice Point:100ohm; Sensor Type:PT100; Temp, RoHS Compliant: Yes |
|
EETimes.com - Press Release - Changmin Tech Introduces 4-Point... Changmin Tech Introduces 4-Point Probe Product Line in the U.S.; Advanced Systems Offer Resistivity Measurement Accuracy and Data Analysis Software See EE Times Information |
|
|
4-Point Probe 4-Point Probe 4-Point Probe Model Type See MEMS and Nanotechnology Exchange Information |
|
|
Prometrics 4-point probe Prometrics 4-point probe Prometrics 4-point probe See MEMS and Nanotechnology Exchange Information |
|
|
2.6.3.2.1. Difference between 2 wiring configurations on five wafers where the probe (#2362) was wired in two different configurations, A and B. The probe is a 4-point probe with many possible wiring |
|
|
11.1. Type A uncertainties from a gauge study of approximately 100 silicon wafers which were certified with a 4-point probe wired in a specific configuration, called configuration A, according to |
|
|
Influence and extraction of series resistances in pseudo-MOS... factor of the pseudo-MOS is accurately evaluated by comparison with 4-point probe measurement taking into account the correction induced by series |
|
|
Equipment Detail | Maryland NanoCenter 4-point probe w/ addt options Location: |
|
|
3T&Associates, Inc. 4-Point Probe Head Features / Specification See 3T & Associates, Inc. Information |
|
|
A novel low-cost high-throughput probe card scanner analyzer... Conventionally, micropositioners and probe tips are manually operated to perform 4-point electrical measurement on each individual device which is a |
|
|
Jandel Hand Applied Four Point Probe 4-point cylindrical probe head can be easily changed See Bridge Technology Information |